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Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N<(Index)2>, Ar, He, Ne and H<(Index)2> by using a galvanic cell
DIN 50450-2 – Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N<(Index)2>, Ar, He, Ne and H<(Index)2> by using a galvanic cell
Product Details
Published:
03/01/1991
Number of Pages:
2
File Size:
1 file
Product Code(s):
2406706, 2406706
Note:
This product is unavailable in Ukraine, Russia, Belarus
