IEC 62416 Ed. 1.0 b – Semiconductor devices – Hot carrier test on MOS transistors
IEC 62416:2010 describes the wafer level hot carrier test on NMOS and PMOS transistors. The test is intended to determine whether the single transistors in a certain (C)MOS process meet the required hot carrier lifetime.
Product Details
Edition:
1.0
Published:
04/26/2010
Number of Pages:
20
File Size:
1 file , 890 KB
Note:
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