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Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking standard by International Electrotechnical Commission, 04/12/2002
Aims at testing and verifying that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board assembly process. This test is applicable for all package types. The test should be considered non-destructive.
Product Details
Edition:
1.0
Published:
04/12/2002
Number of Pages:
9
File Size:
1 file , 410 KB
Note:
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