IEC 60749-5 Ed. 2.0 b

Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test

Published by	Publication Date	Number of Pages
IEC	04/10/2017	18

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Category: IEC

IEC 60749-5 Ed. 2.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test

IEC 60749-5:2017 provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
This second edition cancels and replaces the first edition published in 2003. This edition constitutes a technical revision.
This edition includes the following significant technical changes with respect to the previous edition:
a)   correction of an error in an equation;
b)   inclusion of notes for guidance;
c)   clarification of the applicability of test conditions.