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Semiconductor devices – Mechanical and climatic test methods – Part 17: Neutron irradiation standard by International Electrotechnical Commission, 02/20/2003
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Product Details
Edition:
1.0
Published:
02/20/2003
Number of Pages:
11
File Size:
1 file , 410 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
