IEEE 1545

IEEE 1545 – IEEE Standard for Parametric Data Log Format

New IEEE Standard – Inactive-Withdrawn.Jan 2005: Administratively withdrawn. A language and file format for describing parametric test data is defined. Data types, dataformats, and file formats are included.

Product Details

Published:

11/15/1999

ISBN(s):

0738117757, 9780738117768

Number of Pages:

36

File Size:

1 file , 100 KB

Product Code(s):

STDWD94771

Note:

This product is unavailable in Russia, Belarus