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Standard Guide for Use of an X-Ray Tester (almost equal to10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM F1467 – Standard Guide for Use of an X-Ray Tester (almost equal to10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
1.1 This guide covers recommended procedures for the use of X-ray testers (that is, sources with a photon spectrum having ≈10 keV mean photon energy and ≈50 keV maximum energy) in testing semiconductor discrete devices and integrated circuits for effects from ionizing radiation.
Product Details
Published:
03/01/2018
Number of Pages:
18
File Size:
1 file , 400 KB
Redline File Size:
2 files , 810 KB
Note:
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