BS PD IEC/TR 63133 – Semiconductor devices. Scan based ageing level estimation for semiconductor devices
BS PD IEC/TR 63133:2017 specifies a design technique of performance estimation storageelement, which can monitor semiconductor ageing and characterize ageing level. Theestimated ageing level can be used to improve the reliability of system.
Cross References: IEEE 1149.1:2013
All current amendments available at time of purchase are included with the purchase of this document.
Product Details
Published:
01/29/2018
ISBN(s):
9780580988516
Number of Pages:
20
File Size:
1 file , 1.4 MB
Product Code(s):
30361972, 30361972, 30361972
Note:
This product is unavailable in Ukraine, Russia, Belarus
