IEC 60747-11 Ed. 1.0 b – Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices
Applies to discrete semiconductor devices, excluding optoelectronic devices. Should be read together with the generic specification to which it refers: it gives details of the Quality Assessment Procedures, the inspection requirements, screening sequences, sampling requirements, test and measurement procedures required for the assessment of semiconductor devices.
Product Details
Edition:
1.0
Published:
01/01/1985
Number of Pages:
35
File Size:
1 file , 1.3 MB
Note:
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