IEC 60749-17 Ed. 2.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 17: Neutron irradiation
IEC 60749-17 is used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Product Details
Edition:
2.0
Published:
03/28/2019
Number of Pages:
17
File Size:
1 file , 1000 KB
Note:
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