IEC 60749-36 Ed. 1.0 b – Semiconductor devices – Mechanical and climatic test methods – Part 36: Acceleration, steady state
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
Product Details
Edition:
1.0
Published:
02/13/2003
Number of Pages:
7
File Size:
1 file , 210 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
