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Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test standard by International Electrotechnical Commission, 01/17/2003
Provides a steady-state temperature and humidity bias life test for the purpose of evaluating the reliability of non-hermetic packaged solid-state devices in humid environments.
Product Details
Edition:
1.0
Published:
01/17/2003
Number of Pages:
13
File Size:
1 file , 270 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
