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Semiconductor devices – Mechanical and climatic test methods – Part 6: Storage at high temperature standard by International Electrotechnical Commission, 04/12/2002
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive.
Product Details
Edition:
1.0
Published:
04/12/2002
Number of Pages:
7
File Size:
1 file , 380 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
