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Integrated circuits – Measurement of electromagnetic emissions, 150 kHz to 1 GHz – Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method standard by International Electrotechnical Commission, 04/30/2002
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm coupling network. These methods guarantee a high degree of repeatability and correlation of measurements.
Product Details
Edition:
1.0
Published:
04/30/2002
Number of Pages:
57
File Size:
2 files , 2.8 MB
Part of:
IEC 61967-4 Ed. 1.1 b:2006
Note:
This product is unavailable in Ukraine, Russia, Belarus
