IEC 62374 Ed. 1.0 b – Semiconductor devices – Time dependent dielectric breakdown (TDDB) test for gate dielectric films
Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure
Product Details
Edition:
1.0
Published:
03/29/2007
Number of Pages:
43
File Size:
1 file , 720 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
