IEC 62525 Ed. 1.0 en – Standard Test Interface Language (STIL) for Digital Test Vector Data
Defines a test description language that: Facilitates the transfer of large volumes of digital test vector data from CAE environments to automated test equipment ATE environments; Specifies pattern, format, and timing information sufficient to define the application of digital test vectors to a device under test (DUT); Supports the volume of test vector data generated from structured tests such as scan/automatic test pattern generation (ATPG), integral test techniques such as built-in self test (BIST), and functional test specifications for IC designs and their assemblies, in a format optimized for application in ATE environments.
Product Details
Edition:
1.0
Published:
11/07/2007
Number of Pages:
143
File Size:
1 file , 1.2 MB
Note:
This product is unavailable in Ukraine, Russia, Belarus
