IEC 62526 Ed. 1.0 en – Standard for Extensions to Standard Test Interface Language (STIL) for Semiconductor Design Environments
Provides an interface between digital test generation tools and test equipment. A test description language is defined that:(a) facilitates the transfer of digital test vector data from CAE to ATE environments;(b) specifies patten, format, and timing information sufficant to define the application of digital test vectors to a DUT;and (c) supports the volume of test vector data generated from structured tests.
Product Details
Edition:
1.0
Published:
11/07/2007
Number of Pages:
123
File Size:
1 file , 1.5 MB
Note:
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