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Semiconductor devices – Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment – Part 1: Arbitrary and random mechanical vibrations
IEC 63150-1 Ed. 1.0 b – Semiconductor devices – Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment – Part 1: Arbitrary and random mechanical vibrations
IEC 63150-1:2019 specifies terms and definitions, and test methods for kinetic energy harvesting devices for one-dimensional mechanical vibrations to determine the characteristic parameters under a practical vibration environment. Such vibration energy harvesting devices often have their own non-linear mechanisms to efficiently capture vibration energy in a broadband frequency range.
Product Details
Edition:
1.0
Published:
05/10/2019
Number of Pages:
74
File Size:
1 file , 9.6 MB
Note:
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