IEC 63202-1 Ed. 1.0 b – Photovoltaic cells – Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance.
Product Details
Edition:
1.0
Published:
06/20/2019
Number of Pages:
17
File Size:
1 file , 1.1 MB
Note:
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