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Semiconductor devices – Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors – Part 2: Test method for bipolar degradation due to body diode operation
IEC 63275-2 Ed. 1.0 b – Semiconductor devices – Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors – Part 2: Test method for bipolar degradation due to body diode operation
This part of IEC 63275 gives the test method and a procedure using this method to evaluate the on-state voltage change, on-state resistance change and reverse drain voltage change of silicon carbide (SiC) power MOSFET devices due to body diode operation. This test is not generally requested for Si power transistors.
Product Details
Edition:
1.0
Published:
05/01/2022
ISBN(s):
9782832201213
Number of Pages:
24
File Size:
1 file , 900 KB
Note:
This product is unavailable in Ukraine, Russia, Belarus
