Home JIS JIS C 2162 SALE JIS C 2162$49.00 Original price was: $49.00.$29.00Current price is: $29.00. Test method of long-term reliability of gate insulator for SiC devices at high temperaturestandard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2010 JIS C 2162 quantity Add to cart PDF Format Multi-User Access Printable Online Download Category: JIS Description JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus Related products AS 3497 $58.97 Original price was: $58.97.$35.00Current price is: $35.00. Add to cart ASME Section X-2025 $615.00 Original price was: $615.00.$369.00Current price is: $369.00. Add to cart IPC 1602 $158.00 Original price was: $158.00.$95.00Current price is: $95.00. Add to cart IPC VT-89 $368.00 Original price was: $368.00.$221.00Current price is: $221.00. Add to cart
JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus
