Home JIS JIS C 2162 SALE JIS C 2162$49.00 Original price was: $49.00.$29.00Current price is: $29.00. Test method of long-term reliability of gate insulator for SiC devices at high temperaturestandard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2010 JIS C 2162 quantity Add to cart PDF Format Multi-User Access Printable Online Download Category: JIS Description JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus Related products ULC 661 $166.00 Original price was: $166.00.$100.00Current price is: $100.00. Add to cart IPC J-STD-006C $93.00 Original price was: $93.00.$56.00Current price is: $56.00. Add to cart IPC 4921A $93.00 Original price was: $93.00.$56.00Current price is: $56.00. Add to cart IPC JP002 $93.00 Original price was: $93.00.$56.00Current price is: $56.00. Add to cart
JIS C 2162 – Test method of long-term reliability of gate insulator for SiC devices at high temperature Product Details Published: 01/01/2010 File Size: 1 file , 630 KB Note: This product is unavailable in Russia, Ukraine, Belarus
