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Semiconductor Device, Field Effect, Radiation Hardened (Total Dose and Single Event Effects) Transistor Die, N-Channel and P-Channel, Silicon, Various Types, JANHC and JANKC
MIL MIL-PRF-19500/741B – Semiconductor Device, Field Effect, Radiation Hardened (Total Dose and Single Event Effects) Transistor Die, N-Channel and P-Channel, Silicon, Various Types, JANHC and JANKC
MIL-PRF-19500/741B covers the performance requirements for N-channel and P-channel, enhancement-mode, MOSFET, radiation hardened (total dose and single event effects (SEE)), power transistor die. Two levels of product assurance are provided for each device type as specified in MIL-PRF-19500.
Product Details
Published:
04/13/2018
Number of Pages:
19
File Size:
1 file , 260 KB
Note:
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