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Testing of ceramic raw and basic materials – Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) and electrothermal vaporisation (ETV)
DIN 51096 – Testing of ceramic raw and basic materials – Direct determination of mass fractions of impurities in powders and granules of silicon carbide by inductively coupled plasma optical emission spectrometry (ICP OES) and electrothermal vaporisation (ETV)
Product Details
Published:
07/01/2008
Number of Pages:
26
File Size:
1 file
Product Code(s):
1429385, 1429385
Note:
This product is unavailable in Ukraine, Russia, Belarus
