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Semiconductor devices – Mechanical and climatic test methods – Part 3: External visual inspection standard by International Electrotechnical Commission, 04/09/2002
Aims at verifying that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types.
Product Details
Edition:
1.0
Published:
04/09/2002
Number of Pages:
7
File Size:
1 file , 360 KB
Note:
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